Division IV: Engineering Sciences

Committee on Metrology
and Scientific Instrumentation

Metrology and Measurement Systems Vol. XXIV No. 1
Metrology and Measurement Systems is an international journal, peer-reviewed, quarterly-published, launched in 1988; since 2001 it appears in English. The journal appears both in the paper form and in the electronic form on the platform MetaPress http://www.degruyter.com/view/j/mms. It is indexed by Journal Citation Reports/Science, Thomson Scientific Master Journal List, INSPEC, Scopus, Index Copernicus, Google Scholar, CSA Technology Research, High Tech Research Database, Solid State & Superconductivity.
Impact Factor for 2016: 1.598
5-Year Impact Factor: 1.203
Contributions are invited on all aspects of the research, development and applications of the measurement science and technology.
The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments.
The average publication cycle is 6 months.